Jtag Tech supports boundary scan in PXIe

JTAG Technologies has added to its line of boundary-scan IEEE Std. 1149.1 controllers with a unit supporting the PXIe/Compact PCI-express slot format that now features in some of the latest Automatic Test Equipment based on the PXI(e) standards.

The DataBlaster JT 37x7/PXIe offers sustained test clock speeds of up to 40MHz by use of JTAG Technologies’ proprietary Enhanced Throughput Technology (ETT) system and features an on-board flash image buffer memory.

Supplied with the complementary QuadPOD system, the system offers four synchronised TAPs (Test Access Ports) able to support multi-TAP test targets (UUTs) or gang programming of four single TAP targets.

QuadPOD can also house the full range of JTAG Technologies’ SCIL modules, allowing the user to deploy custom test interfaces (BDM, I2C etc..) or the mixed-signal DAF (Digital, Analog Frequency) measurement module.

The scalable DataBlaster JT 37x7/PXIe range starts with the low-cost entry model JT 3707/PXIe, ideal for high-speed test applications and in-system PLD programming. 
Companion models JT 3717/PXIe and JT 3727/PXIe, optionally fitted with an ETT module for flash ISP, support high-throughput flash programming as well as test and PLD programming.

www.jtag.com

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